Development of near isogenic lines (NILs) for leaf rust resistance utilizing advanced generation segregating lines of RIL population in wheat (Triticum aestivum L.)

Abstract

Near-isogenic lines (NILs) are useful genetic resources for basic genetic studies and further understanding of associated molecularmechanisms. The NILs can be developed through standard methods like backcross breeding or advanced generation segregatinglines. The present study aimed the development of NILs for leaf rust resistance from the advanced generation segregating lines withresidual heterozygosity. Advanced generations segregating lines/heterogeneous inbred families (HIFs) segregating for contrastinginfection types (IT ;1 and 3) for leaf rust were identified from the recombinant inbred lines (RILs) between cross of T. timopheevii derivedintrogression line Selection G12, a resistant parent and a susceptible parent Agra local. The molecular analysis using polymorphic SSRmarkers between parents indicated a high level of similarity with 97.07 and 96.49% resemblance among the contrasting NIL pairs fromHIF1 and HIF5, respectively. These NILs may serve as valuable resources for conducting fine mapping and expression analysis of leafrust resistance in wheat and, therefore, will help to identify candidate gene(s) for leaf rust resistance in Selection G12