Development of Methodologies for the Chemical Quality Control of Zircon, A Precursor for Zirconium Production

Abstract

AbstractMethodologies have been developed for the chemical quality control of zircon mineral by EDXRF and D.C.Arc carrier distillation technique. EDXRF technique was found to be preferred for major and minor constituents including non‐metal analytes, while D.C.Arc carrier distillation OES was found to be good for minor and trace metallic constituents including low Z elements. A comparative evaluation of the analytical performance (detection limit, sensitivity, precision, linear dynamic range) was performed. A multipoint standardization was carried out using the base material of 1 : 1 SiO2 : ZrO2 powder mixture to establish calibration curves for the analytes after identification of interference free and the best performed emission and X‐ray analytical lines. In zircon sample, Si, Zr and Y were found to be present as major constituent, with Ga, Ca, Ru, Rh, Fe, Mn, Mg, I, S as minor and Zn, Cr, Sn, Li as trace constituents. The total uncertainty of the EDXRF measurements was evaluated. The statistical t‐test analysis was carried out for 10 degrees of freedom with 95 % confidence interval. The experimentally obtained t‐values were found to be lower compared to the corresponding tcri value revealing the reliability of the measurements. Elemental distributions of the analytes were also investigated using five different zircon samples.