Abstract
We propose to minimize the sampling time for high-throughput measurements of powder X-ray diffraction (XRD) and X-ray absorption fine structure (XAFS) in synchrotron radiation. The conventional synchrotron radiation powder X-ray diffraction method requires filling of a capillary tube, but a structure-refining diffraction pattern could be obtained by transferring the crushed powder to a tape and rotating the cassette-tape tool by ±5° around the sample position. XAFS spectra could also be measured with the sample attached to the tape. The time required for sample preparation was greatly reduced, which made high-throughput experiments with powders in synchrotron radiation experiments more accessible.
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