Abstract

Magnetic Tunnel Junctions (MTJ) are widely used as magnetic sensors but their major disadvantage is their high noise level at low frequency. Some methods to overcome 1/f noise involve adding magnetic modulation [1] or increasing the MTJ area [2]. In order to get a linear response, in-plane MTJ are usually designed with the free layer (FL) set perpendicularly to the reference. However, for a specific application [3], a symmetric R-H characteristic is more suitable to drive a modulation and should be easily obtained by pinning the FL in the same direction as the reference.The aim of this study is to process MTJs with symmetric R-H curve and high sensitivity. The magnetic stack is composed of a pinned synthetic antiferromagnet, MgO tunnel barrier and CoFeB/NiFe free layer. After patterning micron-size junctions of different shapes, we perform a post-process annealing under magnetic field. In this work, we study different methods to achieve a coherent rotation of the FL magnetization towards the hard axis: i) applying a small external field along the easy axis; ii) using shape anisotropy; iii) using soft pinning by adding an antiferromagnetic layer on the FL separated by a thin Ta spacer [4].Our measurements highlight the importance of FL pinning on the reversibility and smoothness of the R-H curves. Nevertheless, since pinning reduces sensitivity, an optimum trade-off must be found. We observed that shape anisotropy alone is not sufficient to pin the FL (fig.1), but a coherent rotation is achieved by applying an external field. Moreover, our results show the importance of a good alignment between the reference and the easy axis. Compensating for the process misalignement by tilting the applied field allows to reduce the pinning field to 5 Oe (fig.2) with a sensitivity of 3.5%/mT. On the other hand, soft pinning can provide internal pinning ranging from 120 to 0 Oe by increasing the Ta spacer up to 0.25 nm. Choice of the optimum spacer thickness and further process optimizations should reduce hysteresis and improve the sensitivity. ![](https://s3.eu-west-1.amazonaws.com/underline.prod/uploads/markdown_image/1/image/73f780f33019b4c19ae68487962887c0.jpg) Fig.1: R-H curves measured along easy axis Hy and hard axis Hx ![](https://s3.eu-west-1.amazonaws.com/underline.prod/uploads/markdown_image/1/image/b9125ad521ed2eba162c211ac36f36e5.jpg) Fig. 2: R-H curves measured with respect to the reference misalignment (1.6°) and pinning fields Hpin of 5 and -5 Oe

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