Abstract

AbstractA K+-saturated and an NH4+ -saturated smectite from Jelgov 37 Potok (Slovakia) was analysed by X-ray diffraction (XRD) after a series of I to 150 wetting and drying (WD) cycles, and the corresponding distribution functions were calculated using the Dyakonov method. From these data the thicknesses and proportions of different layers were determined. Three kinds of layers (A- 1-00 nm, B-1.26 nm and C-1-52 nm) were detected in the original samples. After 15 WD cycles only A and B type layers were identified in the K-smectite, whereas all three varieties were present during the whole WD treatment in the NH4-smectite. After initial changes the mutual proportion of layers seems to be stable. The 1.00 nm layer is the major layer type in the K-smectite and the 1.26 nm layer is the major layer type in the NH4-smectite. The layer thicknesses evolved during the WD experiments. The systematic changes observed for the NH4-smectite were greater than those for the K-smectite.

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