Abstract
In this work we present the way of nanostructured films study by means of magneto-ellipsometry. The method of interpretation of in situ magneto-optical ellipsometry spectra from the in situ molecular beam epitaxy setup with an integrated magneto-ellipsometric real time synthesis control is described. The method has been successfully tested on Fe/SiO2/Si nanostructures within the model of a homogeneous semi-infinite medium. As a result, the dielectric tensor components for Fe layer were calculated using a developed approach.
Highlights
Related content- Measurements of the magneto-optical properties of PbS-doped silica optical fiber Weilong Dong, Yi Huang, Huangchao Chen et al
In recent years, the magnetic materials for data storage and spintronic devices have deserved significant attention
We suggest that magneto-ellipsometry [2] meets all these requirements
Summary
- Measurements of the magneto-optical properties of PbS-doped silica optical fiber Weilong Dong, Yi Huang, Huangchao Chen et al. - Time Dependent Effect of Magnetic and Magneto-Optical Properties in Cd1-xMnxTe Yuichiro Irie, Kazuko Jochi, Tetsuya Sato et al. - Magnetic Anisotropy and Magneto-Optical Properties of Iron Oxide Films Shuji Urabe, Takuhisa Numata, Seiji Inokuchi et al. View the article online for updates and enhancements. 8th Joint European Magnetic Symposia (JEMS2016) IOP Conf. O A Maximova, N N Kosyrev, S N Varnakov, S A Lyashchenko, I ATarasov, I AYakovlev, O M Maximova, D V Shevtsov and S G Ovchinnikov1,2,3 1Kirensky Institute of Physics, Krasnoyarsk, 660036, Russia 2Reshetnev Siberian State Aerospace University, Krasnoyarsk, 660014, Russia 3Siberian Federal University, Krasnoyarsk, 660041, Russia 4Achinsk Branch of Krasnoyarsk State Agrarian University, Achinsk, 662150, Russia
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