Development of ilmenite-type electronic material CdTi0<sub>3</sub> for devices

Abstract

The correlation between structural and electrical properties of cadmium titanate (CdTiO3) ceramic was established through X-ray diffraction combined with electrical and optical characterization techniques. The compound was prepared using a hightemperature solid-state reaction technique. Preliminary study on some structural aspect of the material using X-ray diffraction pattern showed the formation of singlephase compound in orthorhombic crystal system. Some characteristics of molecular structure of the material were studied by using Fourier transform infrared spectroscopy and ultraviolet visible spectroscopy techniques. The size and distribution of grains in the scanning electron micrograph revealed the polycrystalline nature of the material with size anisotropy and small number of voids. Detailed analysis of temperature-frequency dependence of dielectric parameters (i.e. dielectric constant and tangent loss) has revealed many interesting and important results of the material. The impedance studies of CdTiO3 over a wide range of temperature and frequency in the complex plane formalism with suitable equivalent circuit have shown some correlation between microstructure and electrical properties of the material. From the impedance and dielectric measurements some electrical parameters such as bulk resistance, capacitance, relaxation time and relative dielectric constant were calculated. The variation of DC conductivity with inverse of absolute temperature follows the Arrhenius relation. The study of frequency dependence of AC conductivity suggests that the material obeys Jonscher's universal power law.