Development of EPICS-Based Data Acquisition system for Beam Loss Monitor and sX-map

Abstract

Beam commissioning is underway at KEK’s Superconducting RF Test Facility (STF). Since beam diagnostics are important to realize stable operation, we have developed a time-resolved beam loss distribution monitor as one of the beam diagnostics. This monitor uses up to 16 PIN photodiodes as X-ray sensors to observe X-rays generated due to beam loss of a pulsed beam with a width of approximately 800 μs, which is divided into 100 μs intervals. Thus, 128 data can be acquired per bunch. The data is read out by an EPICS-based data acquisition system. On the other hand, we are also developing an EPICS-based data acquisition system for an inspection method for the superconducting cavities(sX-map) for the vertical test of bare cavities. sX-map strips are inserted inside the stiffener ring at the iris of superconducting cavities. In this presentation, an overview of these EPICS-based data acquisition systems and their integration with the existing control system will be presented.