Abstract
The stability requirements for the James Webb Space Telescope (JWST) optical metering structure are driven by the science objectives of the mission. This structure, JWST Optical Telescope Element (OTE) primary mirror backplane, has to be stable over time at cryogenic temperatures. Successful development of the large, lightweight, deployable, cryogenic metering structure requires verification of structural deformations to nanometer level accuracy in representative test articles at cryogenic temperature. An instantaneous acquisition phase shifting speckle interferometer was designed and built to support the development of JWST Optical Telescope Element (OTE) primary mirror backplane. This paper discusses characterization of the Electronic Speckle Pattern Interferometer (SPS-DSPI) developed for JWST to verify its capabilities to measure structural deformations in large composite structures at cryogenic temperature. Interferometer performance during the Backplane Stability Test Article (BSTA) test that completed the TRL-6 (Technology Readiness Level-6) demonstration of Large Precision Cryogenic Structures will also be discussed.
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