Development of DC Parameter Calibration Module for Digital Integrated Circuit Test System

Abstract

Aiming at the on-site measurement requirements of the integrated circuit test system, this paper designs the DC parameter calibration module of the digital integrated circuit test system based on STM32 single-chip microcomputer as the core control, studies the methods of precision improvement based on multiple groups of devices, noise control, and error compensation, reduce the volume of the device, simplifies the measurement loop in the calibration process, and improves the DC parameter calibration accuracy of the digital channel of the integrated circuit test system, improve the portability and ease of use of the calibration device, and lay the foundation for the calibration device of the new generation integrated circuit test system.