Development of at-wavelength metrology using grating-based shearing interferometry at Diamond Light Source

Abstract

The grating-based shearing interferometer has been established and further developed on B16 at Diamond Light Source. The beamline performances of both an X-ray plane mirror and a compound refractive lens (CRL) have been investigated using this technique. The slope error of the X-ray mirror was retrieved from the wavefront phase gradient, which was measured using two different processing schemes: phase stepping and moiré fringe analysis. The interferometer has demonstrated a high sensitivity with sub-microradian accuracy. Some of the advantages, disadvantages and limitations for the two approaches will also be presented.