Abstract
To study about microstructure and chemical composition of oxide films formed on surface of stainless steel is most important for understanding of stress corrosion cracking (SCC) and irradiation assisted stress corrosion cracking (IASCC). In this work, a new sample preparation method for microstructure observation of oxide films was developed. To prevent to break oxide films during fabrication, surface of specimens were protected with plating. Focused ion beam (FIB) processing was conducted to prepare thin foil samples of cross section of oxide films. After sample preparation, microstructure of cross section of oxide films was observed by transmission electron microscope (FE-TEM), and microscopic chemical composition was analyzed by energy dispersed X-ray spectrometer (EDS). From the results, effects of silicon (Si) doping for oxide film formation in two oxidation conditions are discussed.
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