Abstract
A new X-ray detector using surface plasmon resonance (SPR) is proposed. The detector consists of a prism coated with a thin metal film and semiconductor film. Optical laser pulse induces SPR condition on the metal surface, and synchronized X-ray pulse which is absorbed into the semiconductor film can be detected by measuring the change of the resonance condition of the surface plasmon. The expected time and spatial resolution of this detector is better than that of conventional X-ray detectors by combining this SPR measurement with ultra-short laser pulse as the probe beam. Our preliminary investigation using Au and ZnSe coated prism implies this scheme works well as the detector for the ultra-short X-ray pulse.
Published Version
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