Development of an in situ calibration method for current-to-voltage converters for high-accuracy SI-traceable low dc current measurements

Abstract

For photocurrent measurements with low uncertainties, wide dynamic range reference current-to-voltage converters and a new converter calibration method have been developed at the National Institute of Standards and Technology (NIST). The high-feedback resistors of a reference converter were in situ calibrated on a high-resistivity, printed circuit board placed in an electrically shielded box electrically isolated from the operational amplifier using jumpers. The feedback resistors, prior to their installation, were characterized, selected and heat treated. The circuit board was cleaned with solvents, and the in situ resistors were calibrated using measurement systems for 10 kΩ to 10 GΩ standard resistors. We demonstrate that dc currents from 1 nA to 100 µA can be measured with uncertainties of 55 × 10−6 (k = 2) or lower, which are lower in uncertainties than any commercial device by factors of 10 to 30 at the same current setting. The internal (NIST) validations of the reference converter are described.