Development of an electron-attachment-type negative fullerene ion source

Abstract

An electron-attachment-type negative C60 ion source was developed to intensify the incident negative ion beam current to a tandem accelerator. In this ion source, negative ions are produced by the attachment of low-energy electrons to the sublimated C60. An ion source with a filament and an oven was constructed, and a negative C60 ion beam current of 600 nA was extracted.