Abstract
BackgroundComprehensive datasets quantifying the coupled thermo-mechanical and electrical properties of shape memory alloys (SMAs) are lacking, as are standardized techniques for robust characterization. This hampers accurate modeling and design of SMA-based components. Objective: This work develops an automated experimental system to enable simultaneous measurement of stress-strain-temperature behavior and electrical resistivity evolution in NiTi SMA wires under controlled stress conditions. Methods: Customized test frames apply precise mechanical stresses while allowing for in situ electrical measurements and infrared imaging during complete thermal cycling protocols. Specialized instrumentation including a Keithley 2002 multimeter, Agilent E3631A programmable power supply, and FLIR A615 thermal camera are integrated with LabVIEW-based software routines for complete automation of the characterization process. Rigorous metrology principles are implemented throughout the measurement procedure to improve accuracy, repeatability, and consistency compared to prior manual techniques. Results: Extensive datasets are generated which reveal pronounced stress-dependencies in key SMA material parameters including transformation temperatures, recoverable strain, and electrical resistivity. A 3D regression model describes the comprehensive relationship between resistivity, temperature, and applied stress across the entire characterization domain. Conclusions: The automated measurement framework and methodology establishes a foundation for high-fidelity, reliable acquisition of coupled SMA property data. This will enable more accurate modeling and design of components and systems incorporating SMA actuation or sensing functions.
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