Abstract
The CMS tracking system will demand a large quantity of multi-strip silicon sensors, which must fulfill stringent tolerance criteria to maintain the physics performance in the High Luminosity (HL) phase of the LHC. Thus, a subset of the fabricated sensors must be extensively tested prior to the installation in the main detector system. This will be achieved through measurement of various global and strip parameters of silicon strip sensors as envisaged in a detailed quality assurance program for phase II upgrade of CMS tracker. Also, to handle the large quantity of the pixel and strip sensors and other constraints, the characterization setup should have multi-functionality features, including automation. A fully automated and programmable characterization system for testing silicon multi-strip sensors has been under development at University of Delhi. The entire system is controlled though an Automated Characterization Suite (ACS). Various features of the characterization system along with some measurement results are presented in this work.
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