Abstract
AbstractAn angle‐resolving electron spectrometer has been developed for use with an ultra high vacuum scanning electron microscope. A large cylindrical mirror analyser has been equipped with a parallel detection system for simultaneous recording of electron energy spectra and angle‐resolved images. Two different models have been developed to simulate the spectrometer. Angle‐resolved images and energy spectra of different electron emission functions can be simulated. The angle‐resolved images from amorphous samples were used to check the two simulation models and the performance of the spectrometer. Some initial results of applying the spectrometer on Ag/Ge(111) and Ag/α‐Ge are discussed.
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