Abstract
A portable device for in situ metrology of synchrotron X-ray mirrors based on the near-field speckle scanning technique has been developed. Ultra-high angular sensitivity is achieved by scanning a piece of abrasive paper or filter membrane in the X-ray beam. In addition to the compact setup and ease of implementation, a user-friendly graphical user interface has been developed to ensure that optimizing active X-ray mirrors is simple and fast. The functionality and feasibility of this device have been demonstrated by characterizing and optimizing X-ray mirrors.
Highlights
The successful exploitation of X-ray beams generated by modern third-generation synchrotron light sources, such as Diamond Light Source (Diamond), depends to a significant extent on developments in X-ray optics
Not all beamlines are equipped with sufficient diagnostics, which motivates the creation of a portable in situ metrology device for use on a range of beamlines
In order to perform in situ characterization of mirrors at different hard X-ray beamlines, in this study we present the development and implementation of a portable metrology device based on the X-ray speckle scanning approach
Summary
The successful exploitation of X-ray beams generated by modern third-generation synchrotron light sources, such as Diamond Light Source (Diamond), depends to a significant extent on developments in X-ray optics. Due to their achromaticity and large acceptance aperture, X-ray mirrors are widely used at synchrotron light facilities for micro- and nanofocusing. Accurate in situ metrology is essential to achieve diffraction-limited and coherence-preserved beams (Sawhney et al, 2013). This situation will become increasingly important as synchrotron light sources are upgraded to further improve the photon beam brilliance. Ultra-high angular sensitivity has been demonstrated using the speckle scanning technique
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