Abstract
We describe the development of combining a commercially available scanning near-field optical microscope (SNOM) with a high-optical-throughput spectrometer and a CCD camera for the purpose of investigating the optical properties of thin organic films at the nanometer-scale. The combined system is capable of obtaining either SNOM images or pixel-by-pixel near-field spectroscopy in either transmission or reflection mode. As an initial test sample, we used a thin film of poly(phenylene vinylene) and tris(8-hydroxy)quiisoline ahirainium to obtain both near-field optical transmission and fluorescence images as well as fluorescence spectra.
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