Abstract

A novel, resistance-based porous silicon sensor with Pd nano-structures as hydrogen sensing layer is presented. The sensor operates at room temperature. p-Type Si substrate is subjected to porous Si etching. The substrate is then coated with a thin layer of Pd and annealed at 900 °C. This results in some Pd getting oxidized on porous Si and a thin PdO layer forms on the surface of the substrate. The sensor was tested in the range of 0–1.5% hydrogen. The sensor responded in real time. Unlike conventional thin film-based resistive hydrogen sensors this sensor showed an inverse relationship between increased hydrogen concentration versus resistance. The mechanism driving the changed output is discussed.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call