Abstract
Recently, a novel plasma display panel (PDP)-based X-ray detector (PXD) was developed. The goal of this study is to develop a data acquisition system for use with the PXD as an imaging detector. Since the prototype detector does not have any barrier ribs or a switching device in a detector pixel, a novel pixelation scheme—the line-scan method—is developed for this new detector. To implement line scanning, a multichannel high-voltage switching circuit and a multichannel charge-acquisition circuit are developed. These two circuits are controlled by an FPGA-based digital signal processing board, from which the information about the charge and position of each pixel can be sent to a PC. FPGA-based baseline compensation and switching noise rejection algorithms are used to improve the signal-to-noise ratio (SNR). The characteristic curve of the entire PXD system is acquired, and the correlation coefficients between the X-ray dose, and the signal intensity and the SNR were determined to be approximately 0.99 and 52.9, respectively.
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