Abstract

A new method has been developed to image surface contamination on-site by short range radiation emitters (such as alpha or beta particle emitters). The measurement is performed in direct contact with the contaminated surface and uses a solid scintillator coupled with Silicon Photomultiplier arrays. A proof of principle is performed in laboratory using a simple prototype and multiple alpha and beta calibrated sources. The experimental setup used to acquire the data, as well as the analysis procedure, are described and the detection results and the image reconstruction are discussed with regard to dismantling requirements.

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