Abstract
Recent results achieved at an existing phase contrast imaging and tomography (PCIT) beamline at the Singapore Synchrotron Light Source (SSLS) have shown that high resolution of 2‐dimensional (2D) and 3‐dimensional (3D) imaging with a high resolution (∼2 μm) can be an extremely useful tool for advanced materials characterization. With white radiation it was possible to obtain a high photon flux that can be exploited for real time radiology (100 ms per frame) together with high lateral resolution and high speed in 2D imaging and 3D tomography. Edge enhancement was also demonstrated.
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