Abstract

Quantitative radial profiles have been determined for deuterium and heavy impurities ( A ⩾ 12) trapped on deposition probes in the plasma edge of ISX-B. Silicon samples were exposed to 1, 4 and 12 tokamak discharges at distances of 10 to 50 mm behind the limiter radius for both ohmic and beam-heated plasmas. The species, quantities and saturation behavior of the principal impurities were determined by ion backscattering and channeling analysis, while nuclear reaction D( 3He, p) 4He and damage analyses were used for the detection and depth profiling of deuterium. The components of stainless steel (Fe, Cr, Ni) were found to increase linearly with the number of discharges, while radial profiles for oxygen and D showed saturation effects in a single discharge. Estimates of D energies and both impurity and D fluxes in the plasma-edge are given for ohmically heated and 350 kW neutral beam injected discharges.

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