Abstract
Abstract Despite hybrid organic-inorganic perovskite solar cells (PSCs) have reached a rapid improvement in solar cell efficiency. The long-term operational stability of PSCs is still under course of development. Here, we investigated the infiltration effects of Ag+ into the adjacent hole transporting layer (HTL) in the PSCs, by directly doping Ag+ into the conventional Spiro-MeOTAD layer (HTL) and the essential characterization analysis were also applied. The result distinctly demonstrated that the Ag-ion migration potentially triggers the performance degradation in PSCs. The incorporation of Ag+ brought deep-level defects in the Spiro-MeOTAD layer and consequently caused a deterioration of the hole-transporting ability of Spiro-MeOTAD leading to degradation of solar cell performance. Understanding the impacts of the metal electrode penetration in the HTL will promote advancing in the overall stability performance of PSCs.
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