Abstract
Determining the preferred orientation of plating film is of practical importance. In this work, the Rietveld method and quantitative texture analysis (RM+QTA) are used to analyze the preferred orientation of plating silver film with XRD profile, whose <311> axial texture can be completely described by a set of exponential harmonics index, extracted from a single XRD profile, C41,1(0.609), C61,1(0.278), C81,1(−0.970). The constructed pole figures with the index of the exponential harmonic are following those measured by the multi-axis diffractometer. The method using exponential harmonic index can be extended to characterize the plating by electroplating in a quantitative harmonic description. In addition, a new dimension involving crystallite shape and size is considered in characterizing the preferred orientation.
Highlights
Polycrystalline plating films reveal some degree of preferred orientation owing to the forces evolving crystal growth [1,2,3]
Extracting the preferred orientation from a single X-diffraction profile based on the Rietveld method and quantitative texture analysis (RM + QTA) seems to be more convenient compared with the traditional pole figure analysis procedure, which usually requires the use of a multiaxis diffractometer
The March–Dollase function and exponential harmonics function are employed to correct the preferred orientation of the plating silver film with Rietveld analysis of a single XRD profile, which is further confirmed by the pole
Summary
Polycrystalline plating films reveal some degree of preferred orientation owing to the forces evolving crystal growth [1,2,3]. For X-ray diffraction, at a fixed θ/2θ, the classical technique to determine preferred orientation is via pole figure analysis, which is rather a complex technique and requires special multiaxis texture attachments, the latter provides sample rotation by changing the tilt angle χ and azimuthal angle φ [7]. Extracting the preferred orientation from a single X-diffraction profile based on the Rietveld method and quantitative texture analysis (RM + QTA) seems to be more convenient compared with the traditional pole figure analysis procedure, which usually requires the use of a multiaxis diffractometer.
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