Determining the Optimum Process Mean for the Larger-The-Better Weibull Quality Characteristic

Abstract

In Cho and Leonard's piecewise linear loss function for the larger-the-better quality characteristic, the quality loss is positively and linearly proportional to the deviation from the lower specification limit (LSL) when the quality characteristic is less than the LSL. The quality loss is equal to zero when the quality characteristic is greater than or equal to the LSL. However, the quality loss should be equal to zero when the value of quality characteristic approaches infin- ity for the larger-the-better characteristic. In this paper, we modify Cho and Leonard's piecewise linear loss function for measuring the product quality and determine the optimum process mean. Assuming that the quality characteristic follows a Weibull distribution and is larger-the-better, the application of determining the optimum process mean for the modified Cho and Leonard's model with piecewise linear loss function is discussed.