Abstract
Until recently, quantitative evaluation of the depth of the structural defects has been carried out visually after conducting successive polishing of the ground surface of the glasses and etching. In order to carry out nondestructive control of the depth of the fissured layers according to the method of ellipsometry, it is necessary to use sufficiently reliable values of the optical constants in the volume of the material in the IR-region of the spectrum since the thickness of the fissured layers can vary from a few units up to several tens of microns.
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