Abstract
<p>This paper presents a technique to determine the Dielectric constant and dielectric loss of the building dielectric materials using propagation constant measurements. The material sample is loaded in an X-band (8.5GHz-12.5GHz) rectangular waveguide and its two port S-parameters are measured as a function of frequency using a Vector Network Analyzer without TRL Calibration. The results obtained from samples of dielectric materials (Air, Cellular concrete and Wood) on the X-band frequencies show the validity of the proposed technique to determine the complex permittivity of the building dielectric materials on the X-band frequencies<em>.</em></p>
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