Determination of Trapping Parameters from TSC in Polyethylene

Abstract

The trapping parameters of one of the carrier traps in low-density polyethylene were evaluated by using the X-ray-induced thermally-stimulated current (TSC) technique. The values obtained were Et (trap depth): 0.90 eV, µτ (product of mobility and lifetime): 5×10-13 m2/V and nto (initial density of trapped carriers): 2.9×1020 m-3. Assuming the fast retrapping case, Nt (trap density) was 1.4×1021 m-3 and, assuming the slow retrapping case, St (capture cross-section) and ν (attempt-to-escape frequency) were 1.1×10-17 m2 and 3×1013 sec-1, respectively. Whether the retrapping was fast or slow, was not determined from the TSC results only.