Determination of transition probability for the 655-nm Tl line

Abstract

Studies of high-presure Hg-TlI a.c. (50 Hz) arc plasmas have been used to verify the validity of Boltzmann statistics at the moment of maximum electron density (5 ms) by applying LTE criteria. For a known plasma temperature, the transition probability of the optically-thin 655-nm line of Tl was derived from emission measurements by using the self-reversed 535-nm line of Tl as reference [ A 655 = (3.74±0.37) × 10 6 s -1].