Abstract
Metal impurities contained in high-purity potassium hydrogenphthalate reagents were determined by inductively coupled plasma mass spectrometry (ICP-MS) with sample introduction by electrothermal vaporization (ETV). The impurities were separated from the matrix constituents by ion-exchange separation using Chelex-100 resin before measurement in order to minimize the effect of spectroscopic interferences peculiar to ICP-MS. Ion exchange-ETV-ICP-MS yielded low detection limits in a range 1–10 ng g −1 for eight elements, which were one or two orders of magnitude better than those obtained by conventional nebulization (NEB) ICP-MS. The analytical results for five kinds of potassium hydrogenphthalate reagents agreed satisfactorily with those obtained by direct NEB-ICP-MS and/or ETV-ICP-MS.
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