Abstract

An analytical procedure for the determination of uranium and thorium in the sub-ng/g range as well as of other trace elements in the ng/g to μg/g range in high purity quartz samples is described. The results obtained by inductively coupled plasma mass spectroscopy (ICP-MS) are compared to those obtained by other analytical techniques (instrumental neutron activation analysis, INAA; flame atomic absorption spectrometry, AAS; Zeeman graphite furnace atomic absorption spectrometry, ZGFAAS; total reflection X-ray fluorescence analysis, TRFA; direct current arc optical emission spectrometry, DC-arc OES; and X-ray fluorescence analysis, XRFA). For the ICP-MS measurements, the decomposition of the samples is carried out with HF/HNO3/H2SO4-mixtures. The results obtained by the different methods show reasonable agreement. For uranium and thorium, ICP-MS proves to be the most sensitive method: detection limits of about 50 pg/g can be achieved for both elements.

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