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Abstract
An instrumental photon activation analysis has been developed for the determination of trace elements in boron samples. A simultaneous irradiation of the sample and multielement standards with 30MeV bremsstrahlung produced by a linear electron accelerator for 2-3 hours was applied to measure levels for up to 28 elements nondestructively with practical limits of detection ranging from 0.02 to 10μg. Degrees of inter-element interferences were evaluated. Analytical results for boron samples are presented.
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