Determination of trace Ag, Au, Ge, Pb, Sn and Te by microwave plasma torch atomic emission spectrometry coupled with an electrothermal vaporization sample introduction system

Abstract

An electrothermal vaporization (ETV) sample introduction device tantalum filament was combined with microwave plasma torch atomic emission spectrometry (MPT-AES) for determination of several trace elements. Some operating parameters of the system were optimized. The effects of easily ionized elements (EIEs) on the emission intensities of the tested elements were studied in detail. It was revealed that there was no interference resulting from small amount of sample matrix; while with the existence of large amount of sample matrix, the method of standard addition could be used to determine trace elements in samples. So, no modifier was required in this method. The results indicated that ETV-MPT-AES not only has the advantage of micro sample consumption (a volume of 3 μl for each injection), but also offers high sensitivities for the determination of Ag, Au, Ge, Pb, Sn and Te as compared with those obtained with pneumatic nebulization (PN) MPT-AES.