Abstract

The accumulation of surface charges is a crucial challenge, especially for HVDC components. Accumulated surface charges can change the electric field distribution and generate weak points, especially in case of superimposed transient voltages and, therefore lower the performance e.g. of insulators. Hence, an accurate measurement of the surface potential and so the surface charges is necessary to optimize these components. Commonly, the surface potential is measured with an electrostatic voltmeter. In this study a procedure for determining the spatial impulse response of a compensating electrostatic voltmeter depending on only the surface to probe distance is presented. Based on the performed measurements a mathematical model is developed to describe the capacitive influence and significance of the local surface potential on the measurement result. The actual measurement value is a weighted and averaged value given by the actual position and its surrounding, which is also confirmed by numerical simulations. The performed procedure enables high accuracy of the measurement of surface potentials and so of surface charges using different types of electrostatic voltmeters and shows the limitation of the measurement procedure. This knowledge increases the possibility to design optimized components for HVDC systems.

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