Abstract
Imaging microprobe secondary ion mass spectrometry (SIMS) using a liquid metal ion source (LMIS) has been used to determine the spatial distribution of metal ions in stainless steel. This scanning ion microprobe is used to achieve high resolution chemical maps of the surface of a sample. For conductive samples such as stainless steel, the practical spatial resolution approaches 0.2 μm and the sensitivity varies with the ion of interest. We have obtained important information relating to the distribution of surface contaminants, segregation, and corrosion phenomena of the elements in these alloys. In this report we hope to demonstrate the usefulness of this important new technique by describing its capabilities and by reviewing data obtained from two separate studies involving stainless steel. Significant findings obtained in these mapping experiments were: • . Stainless steel 316 tubing, which had been found previously to be catalytically active, showed remarkable differences between the used and unused samples. Sodium, potassium, and hydrocarbons were found to exist in agglomerations (islands) in the unused tubing, but were very well distributed in the used tubing. • . A used stainless steel impeller was found to be inhomogeneous with respect to iron and chromium. The surface was entirely covered by chlorine, which is believed to be responsible for the corrosion. Water and elevated levels of chloride ion were found inside numerous scratches or fissures covering the surface. The unused stainless steel showed no signs of streaks or segregated metal regions, and was free from fissures.
Published Version
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