Abstract
Quantitative wavelength dispersive X-ray microanalysis was applied for determination of Ba, Ti and Ce concentrations in Ce-doped BaTiO3 ceramics. There are rare cases in wavelength dispersive analysis where the most intense X-ray lines of the analyzed elements overlap. Such is the case when analyzing matrices containing Ba and Ce, where multiple overlap of CeLα1,2 and BaLβ1,4 lines is present. Two independent simplified methods were applied to evaluate this Ce-Ba peak overlap in order to obtain true k-ratios for Ce in BaTiO3: the calibration curve method and the reference spectra fitting method. The experimental conditions of an electron probe microanalyzer were optimized to achieve improved sensitivity and precision of analysis. Pure CeO2 and BaTiO3 were chosen as standards. K-ratios were corrected by the ZAF matrix correction procedure. Results were calculated for the perovskite ABO3 formula considering different modes of dopant incorporation and donor charge compensation.
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