Abstract
The size of the crystal blocks (coherently reflecting regions) that form the bright copper deposits obtained from a sulphuric acid electrolyte in the presence of B-72-11 brightener were determined using electron microscopy techniques (scanning electron microscopy SEM, transmission electron microscopy TEM, replica techniques) and an X-ray technique (Fourier analysis of X-ray line profiles). The concentration interval of the B-72-11 brightener, in which the size of the crystal blocks and the reflectivity and the levelling of the coatings change abruptly, was identified. The difference in the size of the crystal blocks parallel and normal to the substrate was defined. Also the dependence of the twin-fault probability β on the B-72-11 concentration was established, confirming previous working hypotheses on the inclusion of surface-active additives in the octahedral vacancies of normal (111) layers.
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