Abstract
A study was made of the interfacial properties of Poly(pyrrole) (PP) deposited electrochemically onto single crystal p-Si surfaces. The interfacial properties are dependent upon the counterions. The formation of “Quasi-Ohmic” and “non-Ohmic” contacts, respectively, of PP(C1O4) and PP films doped with other counterions (BF4 and para-toluene sulfonate) with p-Si, are explained in-terms of the conductivity of these films and the flat band potential,V fb, of PP relative to that ofp-Si. The PP film seems to passivate or block intrinsic surface states present on thep-Si surface. The differences in the impedance behavior of para-toluene sulfonate doped and C1O4 doped PP are compared.
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