Abstract
We present comparative studies for the exact determination of the refractive index of single crystals using spectroscopic ellipsometry and photonic-mode-structure investigations by means of spatially resolved photoluminescence spectroscopy, especially in the near band-gap spectral range. By applying such complementary methods we can overcome the uncertainties in the determination of the bulk refractive index introduced by surface properties. The physical effects used are the electromagnetic field reflection used by spectroscopic ellipsometry at large scale planar single crystals and the whispering-gallery-mode formation by total internal reflection in confined micro-structures. We demonstrate the applicability of such studies using the example of uniaxial ZnO bulk samples and micro-wires. By assuming a surface near region with electronic properties different from the bulk material, the method presented here gives the refractive index dispersion for both types of samples in an energy range from 1 to 3.4eV.
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