Abstract
The sensitivities of surface plasmon resonance spectroscopy are higher than reflection/transmission measurement in determining the anisotropic properties of an arbitrarily oriented anisotropic thin film. The corrected Airy formula for calculating the reflection coefficient is used to calculate the reflection of the Kretschmann configuration by considering the nonsymmetric reflection phenomenon in anisotropic film. The optical constants and the thickness of the anisotropic film are obtained from the attenuated-total-reflection (ATR) curve.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
