Abstract
A polarization method is proposed for determination of the orientation of the optical axis in a Z-cut uniaxial crystal. The applicability of the method for controlling the deflection angles of the optical axis from the normal to the crystal surface ~0.01° was shown using the example of lithium niobate crystal with a thickness of 514 μm. Peculiarities of the practical implementation of this method and approaches for increasing its accuracy and throughput are considered.
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