Abstract
ABSTRACTElectron excited energy dispersive X-ray spectrometry (EDS) was used to determine the atomic species present in 35 Å diameter CdSe nanocrystallites. Both theoretical modeling and experimental calibration with standard materials were used to relate the relative X-ray intensities to the atomic fractions present in the sample. The EDS results were normalized to those found by elemental analysis, which also detects light elements. With different surface models, and the atomic fractions found by EDS, the number of surface groups per nanocrystallite was determined.
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