Abstract
Resistivity and thermopower measurements were performed on thin films of Bi 2(Te 0.8Se 0.2) 3 prepared by flash evaporation technique. Applying the Jain–Verma theory to the experimental data of Bi 2(Te 0.8Se 0.2) 3, scattering index parameter was evaluated. The value of scattering index parameter was found to lie between −0.3 and −0.2. This indicates the presence of other scattering mechanisms, in addition to the lattice scattering.
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