Abstract
As part of the upgrade program of the advanced Virgo interferometer, the installation of new instrumented baffles surrounding the main test masses is foreseen. As a demonstrator, and to validate the technology, the existing baffle in the area of the input mode cleaner end-mirror will be first replaced by a baffle equipped with photodiodes. This paper presents detailed simulations of the light distribution on the input mode cleaner baffle. They served to validate the proposed layout of the sensors in the baffle, and determine the light exposure of the photodiodes under different scenarios of the interferometer operations, in order to define mitigation strategies for preserving the detector integrity.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
