Abstract
A method is proposed which can be used for an analysis of small-angle X-ray scattering curves exhibited by solid polymers with lamellar structure. The scattering curve is considered to be determined by the positions and the structure of the `amorphous' boundary layers around the lamellar interfaces. The analysis is performed directly, i.e. without the use of model calculations. Application of the method results in giving values for the mean L and the range of fluctuation, δL, of the lamellar thickness, the electron-density defect κ per square unit of the lamellar interface, and the second moment σ2 of the electron-density profile of the boundary layer.
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