Abstract
A scheme based on X-ray dynamical theory is developed to analyze grazing-incidence X-ray diffraction data and to determine the interface structural morphology efficiently with a number of fitting parameters related to the phases and magnitude of the electric susceptibilities. This scheme is applied to surface normal-scans to study the relatively complex interface structure of the YSZ MgO(001) system. It is found that the interface is composed of three types of crystallites of the c-elongated tetragonal structure with thicknesses of about 300, 150 and 50 Å in the direction normal to the interface. The related structural parameters are also deduced.
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