Abstract
We present a method to determine the far-infrared dielectric function parameters of a thin In0.53Ga0.47As layer. We use a detuned Salisbury screen configuration to enhance the interaction of far infrared light with optical phonons in the InGaAs layer. From polarized angle-resolved reflectance spectrum and Raman spectroscopy, we obtain experimental data that we adjust using a dielectric function model fulfilling causality. We provide a complete set of parameters for an analytic expression of In0.53Ga0.47As dielectric function in the optical phonon frequency range and deduce a value for the static dielectric constant.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
